Structure and electronic properties of amorphous As40Se30S30 films prepared by ion-plasma sputtering method

Authors

  • O. Prikhodko Al-Farabi Kazakh National University, IETP, al-Farabi 71, 050040 Almaty, Kazakhstan
  • M. Maltekbasov Zhansygurov Zhetysu State University, 058000, Zhansygurov 187a, Taldykorgan, Kazakhstan
  • N. Almasov Al-Farabi Kazakh National University, IETP, al-Farabi 71, 050040 Almaty, Kazakhstan
  • S. Maximova Al-Farabi Kazakh National University, IETP, al-Farabi 71, 050040 Almaty, Kazakhstan
  • V. Ushanov Al-Farabi Kazakh National University, IETP, al-Farabi 71, 050040 Almaty, Kazakhstan
  • S. Dyusembayev Al-Farabi Kazakh National University, IETP, al-Farabi 71, 050040 Almaty, Kazakhstan
  • S. Kozyukhin Kurnakov Institute of General and Inorganic Chemistry, RAS, 119991, Moscow, Russia

DOI:

https://doi.org/10.26577/2409-6121-2015-2-1-24-29

Keywords:

Key words, ion-plasma sputtering, RF-films, photoconductivity. PACS numbers, 68.55.-a, 73.61.-r

Abstract

The atomic and local structure, as well as the electrical, optical, photoelectrical properties and drift mobility of charge carriers in amorphous As40Se30S30 films, prepared by the method of RF ion-plasma sputtering (RF-films), were studied in comparison with those of the films, prepared by the method of thermal vacuum evaporation (TE-films). These two methods differ significantly in the conditions of substance vaporization and condensation of atoms on a substrate. It was found that the films fabricated by the different methods have differences in structure and electronic parameters. The essential differences in photoconductivity and transport phenomena are observed, too. It was concluded that RF As40Se30S30 films have a modified structure. This leads to changes in the spectrum of extended and localized electronic states in these films, which, in its turn, causes differences in their electronic properties.

References

[1] Sh.Sh. Sarsembinov, O.Yu. Prikhodko, A.P. Ryaguzov, S.Ya. Maksimova. Comparison of atomic structures and electronic properties of amorphous AsSe films // Semicond. Sci .Technol. – 2001. – Vol. 16. – P. 872.
[2] Sh.Sh. Sarsembinov, A.P. O.Yu. Prikhodko, Ryaguzov, S.Ya. Maksimova, V.Z. Ushanov. Local structure and electronic properties of amorphous As2S3 films prepared by different methods // Semicond. Sci. Technol. – 2004. – Vol. 19. – P. 787.
[3] N.F. Mott and E.A. Devis. Electron Processes in Non-Crystalline Materials. – Oxford: Oxford University Press, 1979. 660 p.
[4] K.D. Tsendin. Electron Phenomena in Chalcogenide Glassy Semiconductors. –St Petersburg: Nauka, 1996. 486 p.
[5] W.E. Spear. Drift mobility techniques for the study of electrical transport properties in insulating solids // J. Non-Cryst. Solids. – 1969. – Vol. 1. – P. 197.
[6] J.P. de Neufville, S.C. Moss, S.R. Ovshinsky. Photostructural transformations in amorphous As2Se3 and As2S3 films // J. Non-Cryst. Solids. – 1973. – Vol. 13. – P. 191.
[7] L. Wenyan, S. Sudipta et al. Role of SSeSSe ratio in chemical bonding of As–S–Se glasses investigated by Raman, x-ray photoelectron, and extended x-ray absorption fine structure spectroscopies // J. Appl. Physics. – 2005. – Vol. 98. – P. 053503.
[8] N. Mateleshko, V. Mitsa, M. Veresa, M. Koosa. Investigation of nanophase separation in glassy as 40 se 60 using raman scattering and ab initio calculations // Chalcogen. Letters. – 2004. – Vol. 1. – P. 139–144.
[9] N. Mateleshko, V. Mitsa, M. Veres, M. Koos, A. Stronski. Investigation of nanophase separation in IR optical glasses As40Se60 using resonant Raman scattering // Semicon. Phys., Quant. Elect. Optoelec. – 2004. – Vol. 7. – P. 171.
[10] Sh.Sh. Sarsembinov O.Yu. Prikhodko M.J. Maltekbasov S.Ya. Maksimova A.P. Ryagusov. Soh Deawha. Proc. Intern. Conf. on Advanced Sciences and Technologies – Korea: ICAST-98. – 1998. – 133 p.
[11] Sarsembinov Sh.Sh., Prikhodko O.Yu., Ryaguzov A.P., Maksimova S.Ya., Ushanov V.Z. Atomic structure and short- and medium-range order parameters in amorphous chalcogenide films prepared by different methods // J. of Non- Cryst. Solids. – 2007. – Vol. 353. – P. 2057–2061.

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Published

2016-10-03

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Section

Plasma Physics and Related Technology