SAITOV, E. B.; ZIKRILLAYEV, N. F.; AYUPOV, K. S.; YULDOSHEV, I. A. Determination of the resistance of external parameters to the degradation of the parameters of silicon photocells with input nickel atoms. Physical Sciences and Technology, [S. l.], v. 9, n. 1-2, p. 30–36, 2022. DOI: 10.26577/phst.2022.v9.i1.04. Disponível em: https://phst.kaznu.kz/index.php/journal/article/view/278. Acesso em: 3 dec. 2024.