TURSUNOV, M.; ILIEV, . K.; ISMAYLOV, B. The High-temperature analysis of silicon properties with manganese-oxygen binary complexes. Physical Sciences and Technology, [S. l.], v. 11, n. 1-2, p. 4–12, 2024. DOI: 10.26577/phst2024v11i1a1. Disponível em: https://phst.kaznu.kz/index.php/journal/article/view/366. Acesso em: 3 jul. 2024.