MANAKOV, S.; SAGIDOLDA, Y. Investigation of the physical properties of nanoscale porous silicon films. Physical Sciences and Technology, [S. l.], v. 2, n. 1, 2016. DOI: 10.26577/2409-6121-2015-2-1-4-8. Disponível em: https://phst.kaznu.kz/index.php/journal/article/view/54. Acesso em: 23 nov. 2024.