DIKHANBAYEV, K.; SIVAKOV, V.; TALKENBERG, F.; MUSSABEK, G.; TAURBAYEV, Y.; TANATOV, N.; SHABDAN, E. Electron backscatter diffraction in the silicon nanowires. Physical Sciences and Technology, [S. l.], v. 2, n. 2, 2016. DOI: 10.26577/2409-6121-2015-2-2-4-11. Disponível em: https://phst.kaznu.kz/index.php/journal/article/view/65. Acesso em: 21 nov. 2024.