ABDULLAYEV, J.; SAPAEV, I. Modeling and calibration of electrical features of p-n junctions based on Si and GaAs. Physical Sciences and Technology, [S. l.], v. 11, n. 3-4, p. 39–48, 2024. DOI: 10.26577/phst2024v11i2b05. Disponível em: https://phst.kaznu.kz/index.php/journal/article/view/390. Acesso em: 12 feb. 2025.