Abdullayev J, Sapaev I. Modeling and calibration of electrical features of p-n junctions based on Si and GaAs. Phys. Sci. Technol. [Internet]. 2024 Dec. 20 [cited 2025 Jan. 4];11(3-2):39-48. Available from: https://phst.kaznu.kz/index.php/journal/article/view/390